Evaluation and application of spatial light modulators for optical metrology

نویسندگان

  • Wolfgang Osten
  • Christian Kohler
  • Jan Liesener
چکیده

REFERENCES AND LINKS [1] J. Aloimonos, “Reply, What I have Learned,” Image Understanding, Vol. 60, No. 1, pp. 74-85 (1994). [2] C.-E. Liedtke, “Intelligent Approaches in Image Analysis,” Proc. SPIE, Vol. 3478, pp. 2-10 (1998). [3] W. Osten, “Active Optical Metrology A Definition by Examples,” Proc. SPIE, Vol. 3478, pp. 11-25 (1998). [4] W. Osten, M. Kujawinska, “Active phase measuring metrology.” In: P.K. Rastogi and D. Inaudi (Eds.): Trends in Optical Nondestructive Testing and Inspection, Elsevier Science B.V. 2000, pp. 45-69. [5] W. Osten, W. Jüptner, “New Light Sources and Sensors for Active Optical 3D-Inspection,” Proc. SPIE Vol. 3897, pp. 314-327 (1999). [6] Vialux GmbH, ALP Product Sheet, Chemnitz 2003, www.vialux.de. [7] C. Pruss, H. Tiziani, “Dynamic null lens for aspheric testing using a membrane mirror,” Opt. Comm. 233, 15-19 (2004). [8] W. Li, Th. Bothe, W. Osten, M. Kalms, “Object adapted pattern projection – Part I: generation of inverse patterns,” Opt. & Las Eng. 41, pp. 31-50 (2004). [9] B. E. A. Saleh, M. C. Teich, Fundamentals of Photonics, John Wiley & Sons Inc. New York (1991). [10] W. Osten, W., Jüptner, “Modern optical sensors for 3d shape and deformation measurement,” LaserOpto Oktober Vol. 32, pp. 51-57 (2000) [11] Th. Bothe, W. Osten, A. Gesierich, W. Jüptner, “Compact 3D-Camera,” Proc. SPIE Vol. 4778, pp. 48-59 (2002). [12] B. Carlson, “New turns on light valve technology,” Advanced Imaging, pp.62-63 (1998) [13] S. Krüger, G. Wernicke, W. Osten, D. Kayser, N. Demoli, H. Gruber, “Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors,” Journal of Electronic Imaging 10, pp. 228-233 (2001). ABSTRACT:

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تاریخ انتشار 2005